Development of 2.2 μm emission Ridge Waveguide lasers with low threshold GalnAsSb/GaAlAsSb DH wafers

M. B.Z. Morosini, J. L. Herrera-Pérez, A. C.F. Da Silveira, A. A.G. Von Zuben, M. S.S. Loural, N. B. Patel

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We show that the development of 2.2μm emission low threshold Ridge-Waveguide lasers from GalnAsSb/GaAlAsSb DH wafers is limited by the excessive current spread in the low resistivity p-type active layer.

Original languageEnglish
Title of host publicationConference Digest - 13th IEEE International Semiconductor Laser Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages60-61
Number of pages2
ISBN (Electronic)4930813514
DOIs
StatePublished - 1992
Externally publishedYes
Event13th IEEE International Semiconductor Laser Conference, ISLC 1992 - Takamatsu, Kagawa, Japan
Duration: 21 Sep 199225 Sep 1992

Publication series

NameConference Digest - IEEE International Semiconductor Laser Conference
Volume1992-September
ISSN (Print)0899-9406

Conference

Conference13th IEEE International Semiconductor Laser Conference, ISLC 1992
Country/TerritoryJapan
CityTakamatsu, Kagawa
Period21/09/9225/09/92

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