Crystallization from amorphous structure to hexagonal quantum dots induced by an electron beam on CdTe thin films

M. Becerril, O. Zelaya-Angel, A. C. Medina-Torres, J. R. Aguilar-Hernández, R. Ramírez-Bon, F. J. Espinoza-Beltran

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

Amorphous cadmium-telluride films were prepared by rf sputtering on Corning 7059 glass substrates at room temperature. The deposition time was 10 and 12 h with a thickness of 400 and 480 (±40 nm), respectively. As-prepared films were amorphous according to X-ray diffraction (XRD) patterns, but a win-fit-software analysis of the main XRD broad band suggests a wurtzite structure at short range. Transmission electron microscopy (TEM) at 200 keV produces crystallization of the amorphous CdTe. The TEM-electron beam induces the formation of CdTe quantum dots with the wurtzite hexagonal structure (the metastable structure of CdTe) and with ∼6 nm of average grain size. As effect of a probable distortion of the CdTe crystalline lattice, the unit cell volume (UCV) shrinks to about 30% with respect to the bulk-UCV of CdTe. Besides, the energy band gap increases as expected, according to literature data on quantum confinement.

Original languageEnglish
Pages (from-to)1245-1249
Number of pages5
JournalJournal of Crystal Growth
Volume311
Issue number5
DOIs
StatePublished - 15 Feb 2009

Keywords

  • A1. Crystal morphology
  • A1. Nanostructures
  • A1. X-ray diffractions
  • B2. Semiconducting II-VI materials

Fingerprint

Dive into the research topics of 'Crystallization from amorphous structure to hexagonal quantum dots induced by an electron beam on CdTe thin films'. Together they form a unique fingerprint.

Cite this