TY - JOUR
T1 - Controlled‐Depth and cross‐section preparation techniques for transmission electron microscopy subsurface studies in metals
AU - Garcia‐Borquez, A.
AU - Kesternich, W.
PY - 1993/6/15
Y1 - 1993/6/15
N2 - Thin film specimen preparation from bulk material at a controlled depth below the surface and cross‐section thin film preparation for transmission electron microscope investigations of electrically conducting materials are described. Both techniques are illustrated by austenitic stainless steel, where they have been used complementary to each other for microstructural studies of subsurface ion irradiation damage. The advantages and limitations of both techniques are discussed. © 1993 Wiley‐Liss, Inc.
AB - Thin film specimen preparation from bulk material at a controlled depth below the surface and cross‐section thin film preparation for transmission electron microscope investigations of electrically conducting materials are described. Both techniques are illustrated by austenitic stainless steel, where they have been used complementary to each other for microstructural studies of subsurface ion irradiation damage. The advantages and limitations of both techniques are discussed. © 1993 Wiley‐Liss, Inc.
KW - Austenitic stainless steel
KW - TEM
KW - Thin film preparation
UR - http://www.scopus.com/inward/record.url?scp=0027251584&partnerID=8YFLogxK
U2 - 10.1002/jemt.1070250307
DO - 10.1002/jemt.1070250307
M3 - Artículo
SN - 1059-910X
VL - 25
SP - 255
EP - 263
JO - Microscopy Research and Technique
JF - Microscopy Research and Technique
IS - 3
ER -