Composition depth profiles of superconducting MgB₂ thin films determined by ion beam analysis methods

Engineering & Materials Science

• Superconducting films 100%
• Ion beams 77%
• Glassy carbon 23%
• Substrates 19%
• Sapphire 18%
• Nuclear reactions 11%
• Phase composition 8%
• Boron 7%
• Surface morphology 7%
• Film thickness 7%
• Magnesium 7%
• Evaporation 6%
• Annealing 6%
• X ray diffraction 6%
• Contamination 6%
• Aluminum oxide 6%
• Oxidation 6%
• Scanning electron microscopy 5%
• Silicon 5%

Physics & Astronomy

• ion beams 42%
• profiles 29%
• thin films 28%
• glassy carbon 19%
• sapphire 11%
• superconducting films 8%
• particle energy 7%
• nuclear reactions 6%
• magnesium 6%
• contamination 6%
• boron 5%
• energy spectra 5%
• film thickness 5%
• evaporation 5%
• oxidation 5%
• scanning electron microscopy 4%
• annealing 4%
• silicon 3%
• diffraction 3%
• x rays 3%

Chemistry

• Ion Beam 60%
• Liquid Film 26%
• Chemical Element 8%
• Nuclear Reaction 7%
• Concentration Profile 6%
• Carbon Atom 5%
• Evaporation 4%
• Boron Atom 4%
• Magnesium Atom 4%
• Annealing 4%
• Surface 3%
• Resistance 3%
• X-Ray Diffraction 2%
• Energy 2%
• Oxidation Reaction 2%