Comparative investigation of photoluminescence of silicon wire structures and silicon oxide films

Engineering & Materials Science

• Photoluminescence 100%
• Silicon oxides 89%
• Oxide films 76%
• Porous silicon 73%
• Silicon 48%
• Wire 46%
• Raman scattering 17%
• Atomic force microscopy 15%
• Surface morphology 13%
• Oxides 10%
• Temperature 9%
• Defects 8%
• Chemical analysis 8%

Physics & Astronomy

• silicon oxides 64%
• oxide films 55%
• wire 45%
• porous silicon 44%
• photoluminescence 43%
• silicon 33%
• Raman spectra 7%
• atomic force microscopy 7%
• temperature dependence 6%
• oxides 6%
• defects 5%
• temperature 3%

Chemistry

• Silicon Oxide 76%
• Photoluminescence 47%
• Porosity 35%
• Liquid Film 29%
• Red 21%
• Photoluminescence Spectrum 15%
• Atomic Force Microscopy 12%
• Oxide 8%
• Surface 4%