TY - JOUR
T1 - Automated Functional Test Generation for Digital Systems Through a Compact Binary Differential Evolution Algorithm
AU - Cruz, Alfonso Martinez
AU - Fernández, Ricardo Barrón
AU - Lozano, Herón Molina
AU - Ramírez Salinas, Marco Antonio
AU - Villa Vargas, Luis Alfonso
N1 - Publisher Copyright:
© 2015, Springer Science+Business Media New York.
PY - 2015/8/3
Y1 - 2015/8/3
N2 - At present, the functional verification of a device represents the highest cost during manufacturing. To reduce that cost, several methods have been suggested. In this work we propose a method which produces a set of binary test sequences by means of a Compact binary Differential Evolution algorithm (Compact-BinDE). The strategy employed is based on the use of coverage models and cost functions in the verification process, which are built with relevant conditions or coverage points representing the full device behavior. The main problem is to cover all difficult situations since the relationships between the test points and the input data in the design are not trivial. The test generation method is included with a proposed verification platform based on a simulation representing a hybrid method. The main contribution of this work is that the method obtains test vector sequences that maximize the coverage percentage on run-time device simulation with an efficient search in the binary domain. Also, different to the previous works that used meta-heuristics, the proposed method by means of the Compact-BinDE algorithm can reduce the simulation time used to obtain test sequences that exercise the coverage points. The results show that the proposed method represents a good alternative to generate test sequences to cover the coverage points during the functional verification.
AB - At present, the functional verification of a device represents the highest cost during manufacturing. To reduce that cost, several methods have been suggested. In this work we propose a method which produces a set of binary test sequences by means of a Compact binary Differential Evolution algorithm (Compact-BinDE). The strategy employed is based on the use of coverage models and cost functions in the verification process, which are built with relevant conditions or coverage points representing the full device behavior. The main problem is to cover all difficult situations since the relationships between the test points and the input data in the design are not trivial. The test generation method is included with a proposed verification platform based on a simulation representing a hybrid method. The main contribution of this work is that the method obtains test vector sequences that maximize the coverage percentage on run-time device simulation with an efficient search in the binary domain. Also, different to the previous works that used meta-heuristics, the proposed method by means of the Compact-BinDE algorithm can reduce the simulation time used to obtain test sequences that exercise the coverage points. The results show that the proposed method represents a good alternative to generate test sequences to cover the coverage points during the functional verification.
KW - Binary differential evolution algorithm
KW - Compact binary differential evolution algorithm
KW - Coverage points
KW - Digital systems
KW - Directed functional verification
KW - Functional verification
KW - Meta-heuristics
UR - http://www.scopus.com/inward/record.url?scp=84942913679&partnerID=8YFLogxK
U2 - 10.1007/s10836-015-5540-6
DO - 10.1007/s10836-015-5540-6
M3 - Artículo
SN - 0923-8174
VL - 31
SP - 361
EP - 380
JO - Journal of Electronic Testing: Theory and Applications (JETTA)
JF - Journal of Electronic Testing: Theory and Applications (JETTA)
IS - 4
ER -