An ESPI system for determining in-plane deformations. Three-dimensional analysis of the carrier fringes and a proposal for analysis of transient in-plane deformations

Juan B. Hurtado-Ramos, J. Blanco-García, A. Fernández, F. Ribas

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Fingerprint

Dive into the research topics of 'An ESPI system for determining in-plane deformations. Three-dimensional analysis of the carrier fringes and a proposal for analysis of transient in-plane deformations'. Together they form a unique fingerprint.

Mathematics

Physics & Astronomy

Engineering & Materials Science