TY - JOUR
T1 - Accurate modeling and parameter extraction method for organic TFTs
AU - Estrada, M.
AU - Cerdeira, A.
AU - Puigdollers, J.
AU - Reséndiz, L.
AU - Pallares, J.
AU - Marsal, L. F.
AU - Voz, C.
AU - Iñiguez, B.
N1 - Funding Information:
This work was supported by CONACYT project 39708 in Mexico, by CICYT of the Spanish Government under program TIC2002-04263 and TIC2002-04184, as well as by the Generalitat de Catalunya in Spain under program PICS2003-21.
PY - 2005/6
Y1 - 2005/6
N2 - In this paper we demonstrate the applicability of the unified model and parameter extraction method (UMEM), previously developed by us, to organic thin film transistors, OTFTs. The UMEM, which has been previously used with a-Si:H, polysilicon and nanocrystalline TFTs, provides a much rigorous and accurate determination of main electrical parameters of organic TFTs than previous methods. Device parameters are extracted in a simple and direct way from the experimental measurements, with no need of assigning predetermined values to any other model parameter or using optimization methods. The method can be applied to both experimental and simulated characteristics of organic TFTs, having different geometries and mobility. It provides a very good agreement between transfer, transconductance and output characteristics calculated using parameter values obtained with our extraction procedure and experimental curves. Differences in mobility behavior, as well as other device features that can be analyzed using UMEM are discussed.
AB - In this paper we demonstrate the applicability of the unified model and parameter extraction method (UMEM), previously developed by us, to organic thin film transistors, OTFTs. The UMEM, which has been previously used with a-Si:H, polysilicon and nanocrystalline TFTs, provides a much rigorous and accurate determination of main electrical parameters of organic TFTs than previous methods. Device parameters are extracted in a simple and direct way from the experimental measurements, with no need of assigning predetermined values to any other model parameter or using optimization methods. The method can be applied to both experimental and simulated characteristics of organic TFTs, having different geometries and mobility. It provides a very good agreement between transfer, transconductance and output characteristics calculated using parameter values obtained with our extraction procedure and experimental curves. Differences in mobility behavior, as well as other device features that can be analyzed using UMEM are discussed.
KW - Organic TFT
KW - Parameter extraction
KW - TFT modeling
UR - http://www.scopus.com/inward/record.url?scp=18844441235&partnerID=8YFLogxK
U2 - 10.1016/j.sse.2005.02.004
DO - 10.1016/j.sse.2005.02.004
M3 - Artículo
SN - 0038-1101
VL - 49
SP - 1009
EP - 1016
JO - Solid-State Electronics
JF - Solid-State Electronics
IS - 6
ER -