A novel strategy to replace the damaged element for fault-tolerant induction motor drive

M. A. Rodríguez; A. Claudio; D. Theilliol; L. G. Vela; L. Hernández

doi:10.1109/CIEP.2008.4653825

A novel strategy to replace the damaged element for fault-tolerant induction motor drive

M. A. Rodríguez, A. Claudio, D. Theilliol, L. G. Vela, L. Hernández

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

5 Scopus citations

Abstract

In this paper, the most suitable time to replace to the damaged element in open-loop and closed-loop control for the fault-tolerant induction motor drive system is presented, with a previous stage of fault-diagnostic to detect a short-circuit or open-circuit failure in the power device. The technique is based on the connection of bidirectional switches to isolate electrically the damaged element by mean of fuse blown corresponding, to activate another bidirectional switch to replace only the damaged device by another healthful one. Experimental and simulation results are obtained in order to validate the technique proposed which is based on replacing the damaged element at the most suitable moment in order to diminish the tracking error of the motor current during the fault transient.

Original language	English
Title of host publication	Proceedings of the 11th IEEE International Conference on Power Electronics Congress, CIEP 2008
Pages	123-127
Number of pages	5
DOIs	https://doi.org/10.1109/CIEP.2008.4653825
State	Published - 2008
Externally published	Yes
Event	11th IEEE International Conference on Power Electronics Congress, CIEP 2008 - Cuernavaca, Morelos, Mexico Duration: 24 Aug 2008 → 27 Aug 2008

Publication series

Name	International Power Electronics Congress - CIEP

Conference

Conference	11th IEEE International Conference on Power Electronics Congress, CIEP 2008
Country/Territory	Mexico
City	Cuernavaca, Morelos
Period	24/08/08 → 27/08/08

Access to Document

10.1109/CIEP.2008.4653825

Cite this

Rodríguez, M. A., Claudio, A., Theilliol, D., Vela, L. G., & Hernández, L. (2008). A novel strategy to replace the damaged element for fault-tolerant induction motor drive. In Proceedings of the 11th IEEE International Conference on Power Electronics Congress, CIEP 2008 (pp. 123-127). Article 4653825 (International Power Electronics Congress - CIEP). https://doi.org/10.1109/CIEP.2008.4653825

@inproceedings{36a36ba94d6a488fb2b5733299ccef01,

title = "A novel strategy to replace the damaged element for fault-tolerant induction motor drive",

abstract = "In this paper, the most suitable time to replace to the damaged element in open-loop and closed-loop control for the fault-tolerant induction motor drive system is presented, with a previous stage of fault-diagnostic to detect a short-circuit or open-circuit failure in the power device. The technique is based on the connection of bidirectional switches to isolate electrically the damaged element by mean of fuse blown corresponding, to activate another bidirectional switch to replace only the damaged device by another healthful one. Experimental and simulation results are obtained in order to validate the technique proposed which is based on replacing the damaged element at the most suitable moment in order to diminish the tracking error of the motor current during the fault transient.",

author = "Rodr{\'i}guez, {M. A.} and A. Claudio and D. Theilliol and Vela, {L. G.} and L. Hern{\'a}ndez",

year = "2008",

doi = "10.1109/CIEP.2008.4653825",

language = "Ingl{\'e}s",

isbn = "9781424427185",

series = "International Power Electronics Congress - CIEP",

pages = "123--127",

booktitle = "Proceedings of the 11th IEEE International Conference on Power Electronics Congress, CIEP 2008",

note = "11th IEEE International Conference on Power Electronics Congress, CIEP 2008 ; Conference date: 24-08-2008 Through 27-08-2008",

}

Rodríguez, MA, Claudio, A, Theilliol, D, Vela, LG & Hernández, L 2008, A novel strategy to replace the damaged element for fault-tolerant induction motor drive. in Proceedings of the 11th IEEE International Conference on Power Electronics Congress, CIEP 2008., 4653825, International Power Electronics Congress - CIEP, pp. 123-127, 11th IEEE International Conference on Power Electronics Congress, CIEP 2008, Cuernavaca, Morelos, Mexico, 24/08/08. https://doi.org/10.1109/CIEP.2008.4653825

A novel strategy to replace the damaged element for fault-tolerant induction motor drive. / Rodríguez, M. A.; Claudio, A.; Theilliol, D. et al.
Proceedings of the 11th IEEE International Conference on Power Electronics Congress, CIEP 2008. 2008. p. 123-127 4653825 (International Power Electronics Congress - CIEP).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - In this paper, the most suitable time to replace to the damaged element in open-loop and closed-loop control for the fault-tolerant induction motor drive system is presented, with a previous stage of fault-diagnostic to detect a short-circuit or open-circuit failure in the power device. The technique is based on the connection of bidirectional switches to isolate electrically the damaged element by mean of fuse blown corresponding, to activate another bidirectional switch to replace only the damaged device by another healthful one. Experimental and simulation results are obtained in order to validate the technique proposed which is based on replacing the damaged element at the most suitable moment in order to diminish the tracking error of the motor current during the fault transient.

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ER -

A novel strategy to replace the damaged element for fault-tolerant induction motor drive

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