Engineering & Materials Science
Accelerometers
21%
Blind source separation
35%
Capacitance
28%
Capacitive sensors
25%
Cerium oxide
18%
Cochlear implants
21%
Computer hardware description languages
46%
Current voltage characteristics
20%
Diodes
20%
Doping (additives)
21%
Drain current
31%
Electric potential
25%
Field programmable gate arrays (FPGA)
30%
FinFET
18%
Harmonic distortion
100%
Herbicides
23%
Hydrogen production
16%
Independent component analysis
24%
Indium
19%
Intellectual property
18%
MEMS
44%
Metals
28%
MOSFET devices
47%
Networks (circuits)
19%
Nonlinear distortion
25%
Oxide films
31%
Oxide semiconductors
21%
Oxides
16%
Passivation
26%
Photodetectors
19%
Photolithography
35%
Pixels
33%
Polyimides
17%
Resistors
28%
Schottky barrier diodes
66%
Semiconductor materials
35%
Sensor arrays
16%
Sensors
34%
SPICE
23%
Sputtering
32%
Substrates
25%
Temperature
45%
Thermionic emission
30%
Thin film transistors
75%
Thin films
30%
Transducers
42%
Transistors
46%
Valence bands
17%
X ray photoelectron spectroscopy
20%
Zinc oxide
49%
Chemistry
5-Hydroxymethylfurfural
18%
Application
20%
Band Gap
8%
Behavior as Electrode
7%
Catalyst
7%
Chemical Passivation
19%
Composite Material
7%
Compound Mobility
9%
Conduction Band
7%
Core Level
8%
Displacement
12%
Drain Current
45%
Energy Dispersive X-Ray Spectroscopy
6%
Field Effect
16%
Figure of Merit
16%
Force
10%
Glass Substrate
17%
Glucose
10%
Herbicide
15%
Implant
14%
Interfacial Defect
12%
Ion
6%
L-Arginine
9%
Length
11%
Liquid Film
22%
Mechanical Wave
27%
Mechanics
8%
Metal
6%
Metal Oxide
30%
Micromachining
30%
Noble Metal
7%
Oxalonitrile
7%
Parasitic
18%
Photocatalytic Activity
11%
Physisorption
11%
Polyimide Macromolecule
14%
Reactive Sputtering
7%
Resistance
14%
Schottky Barrier
60%
Schottky Contact
43%
Semiconductor
47%
Simulation
37%
Sputtering
24%
Surface
8%
Thermionic Emission
32%
UV/VIS Spectroscopy
6%
Valence Band
16%
Voltage
37%
Work Function
17%
Zinc Oxide
33%
Physics & Astronomy
accelerometers
8%
actuation
6%
aluminum
13%
capacitance
25%
carbon
9%
characterization
12%
CMOS
18%
complex systems
8%
coupling coefficients
7%
data acquisition
7%
deoxyribonucleic acid
13%
electric contacts
13%
electric potential
16%
electrical measurement
7%
electrodes
9%
entire functions
21%
etchants
9%
field effect transistors
11%
floating
43%
glass
9%
harmonics
10%
ITO (semiconductors)
6%
metal oxide semiconductors
15%
metal oxides
18%
microelectromechanical systems
28%
micromachining
11%
n-type semiconductors
16%
nitrogen
10%
nucleic acids
8%
oxide films
22%
passivity
16%
photolithography
19%
photometers
13%
polyimides
15%
radii
6%
rectification
6%
saturation
7%
Schottky diodes
62%
sensors
22%
shift
16%
simulation
11%
slopes
6%
sputtering
18%
temperature
8%
thermionic emission
15%
thin films
39%
threshold voltage
17%
transducers
36%
transistors
66%
zinc oxides
31%