Engineering & Materials Science
Activation energy
10%
Aluminum oxide
9%
Annealing
19%
Arsenic
8%
Atomic force microscopy
21%
Atoms
12%
Buffer layers
13%
Carrier concentration
10%
Chemical properties
11%
Crystalline materials
24%
Depth profiling
10%
Diffraction patterns
7%
Doping (additives)
11%
Electric fields
11%
Energy gap
26%
Epilayers
17%
Epitaxial films
15%
Heterojunctions
18%
High resolution electron microscopy
8%
Indium
26%
Infrared radiation
25%
Ions
9%
Liquid phase epitaxy
26%
Modulation
7%
Molecular beam epitaxy
100%
Monolayers
13%
Nanostructures
24%
Optical transitions
7%
Optoelectronic devices
11%
Phonons
22%
Photoluminescence
8%
Photoluminescence spectroscopy
20%
Physical properties
17%
Quality control
9%
Raman spectroscopy
31%
Reflection high energy electron diffraction
30%
Rutherford backscattering spectroscopy
9%
Secondary ion mass spectrometry
15%
Semiconductor materials
11%
Semiconductor quantum wells
15%
Solar cells
10%
Spectroscopy
28%
Structural properties
10%
Substrates
63%
Temperature
18%
Thin films
9%
Two dimensional electron gas
17%
Wavelength
8%
X ray diffraction
8%
X ray photoelectron spectroscopy
24%
Chemistry
Alloy
22%
Ambient Reaction Temperature
6%
Amorphous Material
5%
Annealing
15%
Application
9%
Atomic Force Microscopy
14%
Backscattering
9%
Band Gap
14%
Buffer Solution
5%
Corrugated Surface
5%
Deep Impurity Level
7%
Depth Profiling
12%
Electric Field
12%
Emission Peak
10%
Energy
10%
Epitaxial Film
14%
Epitaxial Growth
5%
Hexagonal Space Group
10%
Hole Concentration
7%
Liquid Film
8%
Liquid Phase Epitaxy
21%
LO Phonon
17%
Molecular Beam Epitaxy
47%
Monolayer
7%
Nanomaterial
12%
Optoelectronics
9%
Phonon
9%
Photoluminescence Spectroscopy
10%
Photoluminescence Spectrum
7%
Quality Control
9%
Quantum Dot
17%
Raman Spectroscopy
18%
Reaction Activation Energy
6%
Reflection High Energy Electron Diffraction
12%
Rutherford Backscattering Spectroscopy
6%
Secondary Ion Mass Spectroscopy
5%
Selection Rule
8%
Semiconductor
11%
Solar Cell
8%
Spectroscopy
14%
Strain
13%
Surface
17%
TEM Image
5%
Wavelength
7%
X-Ray Photoelectron Spectrum
11%
Physics & Astronomy
atomic force microscopy
9%
azimuth
5%
backscattering
8%
caps
10%
characterization
6%
depletion
7%
diffraction
8%
diffraction patterns
5%
electric fields
9%
electron diffraction
9%
epitaxy
9%
high energy electrons
10%
high resolution
6%
indium
19%
interference
6%
manganese
6%
modulation
11%
molecular beam epitaxy
41%
nitrides
10%
nitrogen
9%
nitrogen plasma
12%
oscillations
11%
phonons
6%
photoluminescence
8%
profiles
8%
quantum dots
7%
quantum Hall effect
11%
quantum wells
15%
quantum wires
9%
quaternary alloys
13%
Raman spectroscopy
15%
room temperature
5%
sapphire
6%
secondary ion mass spectrometry
17%
self assembly
20%
spectroscopy
9%
surface diffusion
6%
x rays
8%