TY - JOUR
T1 - Thermoluminescence sensitivity of daily-use materials
AU - Correcher, V.
AU - Garcia-Guinea, J.
AU - Rivera, T.
N1 - Funding Information:
This work has been supported by the CICYT (FIS2007-61823) and ComunidadAutonoma de Madrid (CAM) MATERNAS (S-0505/MAT/0094) projects.
PY - 2009/4
Y1 - 2009/4
N2 - The thermoluminescence (TL) response of silicon-rich daily-use materials, namely charoite (silicate gemstone), Spanish dental crown, phone chip and Spanish glass has been investigated. All the samples previously characterised by means of X-ray diffraction, electron microscopy associated with energy-dispersion and wavelength-dispersive spectrometry and X-ray fluorescence exhibit a reasonable sensitivity to ionising radiation. The preliminary results, based on their TL properties, allow us to speculate that these materials could be potentially of interest in situations where conventional dosimetric systems are not available. The dose dependence of the 400nm TL emission of the studied samples displays a very good linearity in the range of 0.1-10Gy.
AB - The thermoluminescence (TL) response of silicon-rich daily-use materials, namely charoite (silicate gemstone), Spanish dental crown, phone chip and Spanish glass has been investigated. All the samples previously characterised by means of X-ray diffraction, electron microscopy associated with energy-dispersion and wavelength-dispersive spectrometry and X-ray fluorescence exhibit a reasonable sensitivity to ionising radiation. The preliminary results, based on their TL properties, allow us to speculate that these materials could be potentially of interest in situations where conventional dosimetric systems are not available. The dose dependence of the 400nm TL emission of the studied samples displays a very good linearity in the range of 0.1-10Gy.
KW - Daily-use materials
KW - Dosimetry
KW - Thermoluminescence
UR - http://www.scopus.com/inward/record.url?scp=67651153018&partnerID=8YFLogxK
U2 - 10.1080/10420150902734064
DO - 10.1080/10420150902734064
M3 - Artículo
SN - 1042-0150
VL - 164
SP - 232
EP - 239
JO - Radiation Effects and Defects in Solids
JF - Radiation Effects and Defects in Solids
IS - 4
ER -