Influence of annealing on the critical temperature of Bi-Pb-Sr-Ca-Cu-O thin films

E. Díaz-Valdés; C. Mejía-García; J. L. López-López; M. Jergel

doi:10.1007/s10854-007-9286-5

Influence of annealing on the critical temperature of Bi-Pb-Sr-Ca-Cu-O thin films

Título traducido de la contribución: Influencia del recocido en la temperatura crítica de películas delgadas de Bi-Pb-Sr-Ca-Cu-O

E. Díaz-Valdés, C. Mejía-García, J. L. López-López, M. Jergel

Escuela Superior de Física y Matemáticas (ESFM)

Producción científica: Contribución a una revista › Artículo › revisión exhaustiva

1 Cita (Scopus)

Resumen

Superconducting Bi-Pb-Sr-Ca-Cu-O (BPSCCO) thin films were grown on MgO substrates by a spray pyrolysis technique, followed by a solid-state reaction. The thin films with nominal composition Bi _1.65 Pb _0.4Sr _1.2Ca _1.2Cu _2.5 (NO ₃) _δ were grown varying mainly the annealing temperature between 835 and 855 °C in order to observe the influence on the critical temperature T _c. At 855 °C the higher T _c was obtained for the 2212 phase. The thin films were then analyzed by X-ray diffraction, R-T measurements and atomic absorption spectroscopy.

Título traducido de la contribución	Influencia del recocido en la temperatura crítica de películas delgadas de Bi-Pb-Sr-Ca-Cu-O
Idioma original	Inglés
Páginas (desde-hasta)	1167-1170
Número de páginas	4
Publicación	Journal of Materials Science: Materials in Electronics
Volumen	18
N.º	11
DOI	https://doi.org/10.1007/s10854-007-9286-5
Estado	Publicada - nov. 2007

Acceder al documento

10.1007/s10854-007-9286-5

Otros archivos y enlaces

Enlace a la publicación en Scopus

Citar esto

@article{251d6e67c31744da84cf71d9a53d2fb5,

title = "Influence of annealing on the critical temperature of Bi-Pb-Sr-Ca-Cu-O thin films",

abstract = "Superconducting Bi-Pb-Sr-Ca-Cu-O (BPSCCO) thin films were grown on MgO substrates by a spray pyrolysis technique, followed by a solid-state reaction. The thin films with nominal composition Bi 1.65 Pb 0.4Sr 1.2Ca 1.2Cu 2.5 (NO 3) δ were grown varying mainly the annealing temperature between 835 and 855 °C in order to observe the influence on the critical temperature T c. At 855 °C the higher T c was obtained for the 2212 phase. The thin films were then analyzed by X-ray diffraction, R-T measurements and atomic absorption spectroscopy.",

author = "E. D{\'i}az-Vald{\'e}s and C. Mej{\'i}a-Garc{\'i}a and L{\'o}pez-L{\'o}pez, {J. L.} and M. Jergel",

year = "2007",

month = nov,

doi = "10.1007/s10854-007-9286-5",

language = "Ingl{\'e}s",

volume = "18",

pages = "1167--1170",

journal = "Journal of Materials Science: Materials in Electronics",

issn = "0957-4522",

number = "11",

}

TY - JOUR

T1 - Influence of annealing on the critical temperature of Bi-Pb-Sr-Ca-Cu-O thin films

AU - Díaz-Valdés, E.

AU - Mejía-García, C.

AU - López-López, J. L.

AU - Jergel, M.

PY - 2007/11

Y1 - 2007/11

N2 - Superconducting Bi-Pb-Sr-Ca-Cu-O (BPSCCO) thin films were grown on MgO substrates by a spray pyrolysis technique, followed by a solid-state reaction. The thin films with nominal composition Bi 1.65 Pb 0.4Sr 1.2Ca 1.2Cu 2.5 (NO 3) δ were grown varying mainly the annealing temperature between 835 and 855 °C in order to observe the influence on the critical temperature T c. At 855 °C the higher T c was obtained for the 2212 phase. The thin films were then analyzed by X-ray diffraction, R-T measurements and atomic absorption spectroscopy.

AB - Superconducting Bi-Pb-Sr-Ca-Cu-O (BPSCCO) thin films were grown on MgO substrates by a spray pyrolysis technique, followed by a solid-state reaction. The thin films with nominal composition Bi 1.65 Pb 0.4Sr 1.2Ca 1.2Cu 2.5 (NO 3) δ were grown varying mainly the annealing temperature between 835 and 855 °C in order to observe the influence on the critical temperature T c. At 855 °C the higher T c was obtained for the 2212 phase. The thin films were then analyzed by X-ray diffraction, R-T measurements and atomic absorption spectroscopy.

UR - http://www.scopus.com/inward/record.url?scp=34548167819&partnerID=8YFLogxK

U2 - 10.1007/s10854-007-9286-5

DO - 10.1007/s10854-007-9286-5

M3 - Artículo

AN - SCOPUS:34548167819

SN - 0957-4522

VL - 18

SP - 1167

EP - 1170

JO - Journal of Materials Science: Materials in Electronics

JF - Journal of Materials Science: Materials in Electronics

IS - 11

ER -

Influence of annealing on the critical temperature of Bi-Pb-Sr-Ca-Cu-O thin films

Resumen

Acceder al documento

Otros archivos y enlaces

Huella

Citar esto