TY - JOUR
T1 - Electrical conductivity percolation in the (CdTe)1-xTe x system
AU - Ramírez-Bon, R.
AU - Espinoza-Beltrán, F. J.
AU - Pedroza-Montero, M.
AU - Ruíz, F.
AU - González-Hernández, J.
AU - Zelaya-Angel, O.
AU - Sánchez-Sinencio, F.
PY - 1994
Y1 - 1994
N2 - The critical volume fraction for conductivity percolation in the di-phasic system (CdTe)1-x Tex has been determined using atomic force microscopy. The onset for rapid increase in the electrical conductivity is found at a volume fraction of Te of about 0.4. According to previous theoretical calculations this value is characteristic of a system with two-dimensional symmetry. It is also found that the Te phase grows in the form of columns, which explains the observed critical volume fraction value for percolation in the conductivity measurements.
AB - The critical volume fraction for conductivity percolation in the di-phasic system (CdTe)1-x Tex has been determined using atomic force microscopy. The onset for rapid increase in the electrical conductivity is found at a volume fraction of Te of about 0.4. According to previous theoretical calculations this value is characteristic of a system with two-dimensional symmetry. It is also found that the Te phase grows in the form of columns, which explains the observed critical volume fraction value for percolation in the conductivity measurements.
UR - http://www.scopus.com/inward/record.url?scp=36449004414&partnerID=8YFLogxK
U2 - 10.1063/1.112429
DO - 10.1063/1.112429
M3 - Artículo
SN - 0003-6951
VL - 65
SP - 3254
EP - 3256
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 25
ER -