Resumen
CdTe films were deposited by closed space sublimation from different CdTe:Bi targets (from non-doped up to 0.16at.%) previously sintered by the Bridgman method. X-ray diffraction measurements demonstrate that CdTe films are formed and Bi is incorporated. Electrical and optical characterizations show that thin films reproduce the bulk material behaviour with a decrease in resistivity and an increase in photoconductivity. Also a limit is found in the increase of photoconductivity properties versus Bi concentration.
Idioma original | Inglés |
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Número de artículo | 011 |
Páginas (desde-hasta) | 7163-7169 |
Número de páginas | 7 |
Publicación | Journal of Physics Condensed Matter |
Volumen | 18 |
N.º | 31 |
DOI | |
Estado | Publicada - 9 ago. 2006 |