A weighted linearization method for highly rf-pa nonlinear behavior based on the compression region identification

Jose Alejandro Galaviz-Aguilar, Cesar Vargas-Rosales, José Ricardo Cárdenas-Valdez, Yasmany Martínez-Reyes, Everardo Inzunza-González, Yuma Sandoval-Ibarra, José Cruz Núñez-Pérez

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Resumen

In this paper, we present an adaptive modeling and linearization algorithm using the weighted memory polynomial model (W-MPM) implemented in a chain involving the indirect learning approach (ILA) as a linearization technique. The main aim of this paper is to offer an alternative to correcting the undesirable effect of spectral regrowth based on modeling and linearization stages, where the 1-dB compression point (P1dB) of a nonlinear device caused by memory effects within a short time is considered. The obtained accuracy is tested for a highly nonlinear behavior power amplifier (PA) properly measured using a field-programmable gate array (FPGA) system. The adaptive modeling stage shows, for the two PAs under test, performances with accuracies of −32.72 dB normalized mean square error (NMSE) using the memory polynomial model (MPM) compared with −38.03 dB NMSE using the W-MPM for the (i) 10 W gallium nitride (GaN) high-electron-mobility transistor (HEMT) radio frequency power amplifier (RF-PA) and of −44.34 dB NMSE based on the MPM and −44.90 dB NMSE using the W-MPM for (ii) a ZHL-42W+ at 2000 MHz. The modeling stage and algorithm are suitably implemented in an FPGA testbed. Furthermore, the methodology for measuring the RF-PA under test is discussed. The whole algorithm is able to adapt both stages due to the flexibility of the W-MPM model. The results prove that the W-MPM requires less coefficients compared with a static model. The error vector magnitude (EVM) is estimated for both the static and adaptive schemes, obtaining a considerable reduction in the transmitter chain. The development of an adaptive stage such as the W-MPM is ideal for digital predistortion (DPD) systems where the devices under test vary their electrical characteristics due to use or aging degradation.

Idioma originalInglés
Número de artículo2942
PublicaciónApplied Sciences (Switzerland)
Volumen11
N.º7
DOI
EstadoPublicada - 1 abr 2021

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