Weak quantum confinement and polaritons in ZnO and ZnO Cu nanocrystals prepared by electrochemical method

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Abstract

Photoluminescence, X-ray diffraction, Scanning electron microscopy and Raman scattering have been used for the optical and structural characterization of ZnO and ZnO Cu nanocrystals (NCs) of various sizes. The samples prepared by an electrochemical method have a size from the range 60 to 600 nm after a heat treatment for 2 hours at 400 °C in ambient air. X-ray diffraction diagrams present a small shift of peaks that testifies on a change in the lattice parameters of NCs with decreasing the NC size. The Raman scattering technique presents the several active modes including the surface phonon mode. The Raman intensity increases with decreasing the NC size is attributed to the surface enhanced Raman scattering (SERS) effect in ZnO Cu NCs. Photoluminescence spectra show a free exciton and defect-related emission. The intensity stimulation of exciton-related PL bands with NC size decreasing up to 60 nm is attributed to the realization of the week confinement and the exciton-light coupling with the formation of polariton in small size ZnO NCs.

Translated title of the contributionConfinamiento cuántico débil y polaritones en nanocristales de ZnO y ZnO Cu preparados por método electroquímico
Original languageEnglish
Title of host publicationWide Bandgap Semiconductor Materials and Devices 16
EditorsS. Jang, K. Shenai, G. W. Hunter, F. Ren, C. O'Dwyer, K. C. Mishra
PublisherElectrochemical Society Inc.
Pages267-274
Number of pages8
Edition1
ISBN (Electronic)9781607685913
DOIs
StatePublished - 2015
EventSymposium on Wide Bandgap Semiconductor Materials and Devices 16 - 227th ECS Meeting - Chicago, United States
Duration: 24 May 201528 May 2015

Publication series

NameECS Transactions
Number1
Volume66
ISSN (Print)1938-6737
ISSN (Electronic)1938-5862

Conference

ConferenceSymposium on Wide Bandgap Semiconductor Materials and Devices 16 - 227th ECS Meeting
Country/TerritoryUnited States
CityChicago
Period24/05/1528/05/15

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