TY - JOUR
T1 - Using a floating-gate MOS transistor as a transducer in a MEMS gas sensing system
AU - Barranca, Mario Alfredo Reyes
AU - Mendoza-Acevedo, Salvador
AU - Flores-Nava, Luis M.
AU - Avila-García, Alejandro
AU - Vazquez-Acosta, E. N.
AU - Moreno-Cadenas, José Antonio
AU - Casados-Cruz, Gaspar
PY - 2010/11
Y1 - 2010/11
N2 - Floating-gate MOS transistors have been widely used in diverse analog and digital applications. One of these is as a charge sensitive device in sensors for pH measurement in solutions or using gates with metals like Pd or Pt for hydrogen sensing. Efforts are being made to monolithically integrate sensors together with controlling and signal processing electronics using standard technologies. This can be achieved with the demonstrated compatibility between available CMOS technology and MEMS technology. In this paper an in-depth analysis is done regarding the reliability of floating-gate MOS transistors when charge produced by a chemical reaction between metallic oxide thin films with either reducing or oxidizing gases is present. These chemical reactions need temperatures around 200 °C or higher to take place, so thermal insulation of the sensing area must be assured for appropriate operation of the electronics at room temperature. The operation principle of the proposal here presented is confirmed by connecting the gate of a conventional MOS transistor in series with a Fe2O3 layer. It is shown that an electrochemical potential is present on the ferrite layer when reacting with propane.
AB - Floating-gate MOS transistors have been widely used in diverse analog and digital applications. One of these is as a charge sensitive device in sensors for pH measurement in solutions or using gates with metals like Pd or Pt for hydrogen sensing. Efforts are being made to monolithically integrate sensors together with controlling and signal processing electronics using standard technologies. This can be achieved with the demonstrated compatibility between available CMOS technology and MEMS technology. In this paper an in-depth analysis is done regarding the reliability of floating-gate MOS transistors when charge produced by a chemical reaction between metallic oxide thin films with either reducing or oxidizing gases is present. These chemical reactions need temperatures around 200 °C or higher to take place, so thermal insulation of the sensing area must be assured for appropriate operation of the electronics at room temperature. The operation principle of the proposal here presented is confirmed by connecting the gate of a conventional MOS transistor in series with a Fe2O3 layer. It is shown that an electrochemical potential is present on the ferrite layer when reacting with propane.
KW - Floating-gate MOSFET
KW - Gas sensor
KW - MEMS
UR - http://www.scopus.com/inward/record.url?scp=84871102394&partnerID=8YFLogxK
U2 - 10.3390/s101110413
DO - 10.3390/s101110413
M3 - Artículo
SN - 1424-8220
VL - 10
SP - 10413
EP - 10434
JO - Sensors (Switzerland)
JF - Sensors (Switzerland)
IS - 11
ER -