Thermal activation of excitons in asymmetric InAs dots-in-a-well In xGa1-xAs/GaAs structures

T. V. Torchynska, J. L. Casas Espinola, L. V. Borkovska, S. Ostapenko, M. Dybiec, O. Polupan, N. O. Korsunska, A. Stintz, P. G. Eliseev, K. J. Malloy

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Abstract

Photoluminescence, its temperature dependence, and photoluminescence excitation spectra of InAs quantum dots embedded in asymmetric Inx Ga1-x AsGaAs quantum wells [dots in a well (DWELL)] have been investigated as a function of the indium content x (x=0.10-0.25) in the capping Inx Ga1-x As layer. The asymmetric DWELL structures were created with the aim to investigate the influence of different barrier values at the quantum dot (QD)/quantum well interface on the photoluminescence thermal quenching process. The set of rate equations for the two stage model for the capture and thermal escape of excitons in QDs are solved to analyze the nature of thermal activation energies for the QD photoluminescence quenching process. The two stage model for exciton thermal activation was confirmed experimentally in the investigated QD structures as well. The localization of nonradiative defects in InAsInGaAs DWELL structures is discussed on the base of comparison of theoretical and numerically calculated (fitting) results.

Original languageEnglish
Article number024323
JournalJournal of Applied Physics
Volume101
Issue number2
DOIs
StatePublished - 2007

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