Simultaneous one-shot profilometry and gamma correction

Cesar Augusto Garcia-Isais, Noé Alcalá Ochoa, Javier Cruz-Salgado

Research output: Contribution to journalArticlepeer-review


© 2019 Society of Photo-Optical Instrumentation Engineers (SPIE). We propose a method to correct the nonlinearities introduced by the projector and camera system in one-shot fringes projection profilometry. It is shown that the gamma value can be calculated with high precision employing Fourier techniques. Fourier and phase shifting phase extraction experiments are carried out to show the applicability of the method.
Original languageAmerican English
JournalOptical Engineering
StatePublished - 1 Mar 2019


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