Simultaneous one-shot profilometry and gamma correction

Cesar Augusto Garcia-Isais, Noé Alcalá Ochoa, Javier Cruz-Salgado

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

We propose a method to correct the nonlinearities introduced by the projector and camera system in one-shot fringes projection profilometry. It is shown that the gamma value can be calculated with high precision employing Fourier techniques. Fourier and phase shifting phase extraction experiments are carried out to show the applicability of the method.

Original languageEnglish
Article number034104
JournalOptical Engineering
Volume58
Issue number3
DOIs
StatePublished - 1 Mar 2019

Keywords

  • fast Fourier transform
  • gamma correction
  • profilometry
  • shape measurement

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