Abstract
We propose a method to correct the nonlinearities introduced by the projector and camera system in one-shot fringes projection profilometry. It is shown that the gamma value can be calculated with high precision employing Fourier techniques. Fourier and phase shifting phase extraction experiments are carried out to show the applicability of the method.
Original language | English |
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Article number | 034104 |
Journal | Optical Engineering |
Volume | 58 |
Issue number | 3 |
DOIs | |
State | Published - 1 Mar 2019 |
Keywords
- fast Fourier transform
- gamma correction
- profilometry
- shape measurement