Simultaneous one-shot profilometry and gamma correction

Cesar Augusto Garcia-Isais, Noé Alcalá Ochoa, Javier Cruz-Salgado

    Research output: Contribution to journalArticlepeer-review

    Abstract

    We propose a method to correct the nonlinearities introduced by the projector and camera system in one-shot fringes projection profilometry. It is shown that the gamma value can be calculated with high precision employing Fourier techniques. Fourier and phase shifting phase extraction experiments are carried out to show the applicability of the method.

    Original languageEnglish
    Article number034104
    JournalOptical Engineering
    Volume58
    Issue number3
    DOIs
    StatePublished - 1 Mar 2019

    Keywords

    • fast Fourier transform
    • gamma correction
    • profilometry
    • shape measurement

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