Polycrystalline Cd1-xZnxTe thin films on glass by pulsed laser deposition

A. Aydinli, A. Compaan, G. Contreras-Puente, Alice Mason

Research output: Contribution to journalArticlepeer-review

45 Scopus citations

Abstract

Polycrystalline thin films of Cd1-xZnxTe on glass were grown by pulsed laser deposition using an XeCl excimer laser. X-ray diffraction, optical absorption, Raman scattering and energy dispersive x-ray analysis were used to characterize these films. The grains show a predominant <111> orientation with considerable amounts of <113> for the alloys. The band gap energy exhibits a small amount of bowing and the phonons display the expected two-mode behavior. Substrate temperatures above 275°C resulted in optical quality films with good stochiometry for deposition rates below ∼ 1 Å/ pulse.

Original languageEnglish
Pages (from-to)465-468
Number of pages4
JournalSolid State Communications
Volume80
Issue number7
DOIs
StatePublished - Nov 1991
Externally publishedYes

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