One shot profilometry using phase partitions

C. A. García-Isáis; Noé Alcalá Ochoa

doi:10.1016/j.optlaseng.2014.12.016

One shot profilometry using phase partitions

C. A. García-Isáis, Noé Alcalá Ochoa

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

Shape measurement using structured light systems involves the difficulty of detecting sharp discontinuities higher than one period of the projected fringe pattern; moreover, phase unwrapping becomes a problem. In this paper, a method to retrieve surface topography trough the projection of a single fringe pattern in gray levels is proposed. The correct phase is unwrapped through the use of Fourier methods and partition functions obtained from the phase. Experimental results show that the method can deal with the projection of high frequency fringes, being limited mainly by the resolution of the projector-detector system.

Original language	English
Pages (from-to)	111-120
Number of pages	10
Journal	Optics and Lasers in Engineering
Volume	68
DOIs	https://doi.org/10.1016/j.optlaseng.2014.12.016
State	Published - May 2015
Externally published	Yes

Keywords

FFT
FTP
Profilometry
Shape measurement

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10.1016/j.optlaseng.2014.12.016

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abstract = "Shape measurement using structured light systems involves the difficulty of detecting sharp discontinuities higher than one period of the projected fringe pattern; moreover, phase unwrapping becomes a problem. In this paper, a method to retrieve surface topography trough the projection of a single fringe pattern in gray levels is proposed. The correct phase is unwrapped through the use of Fourier methods and partition functions obtained from the phase. Experimental results show that the method can deal with the projection of high frequency fringes, being limited mainly by the resolution of the projector-detector system.",

keywords = "FFT, FTP, Profilometry, Shape measurement",

author = "Garc{\'i}a-Is{\'a}is, {C. A.} and {Alcal{\'a} Ochoa}, No{\'e}",

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AU - García-Isáis, C. A.

AU - Alcalá Ochoa, Noé

PY - 2015/5

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AB - Shape measurement using structured light systems involves the difficulty of detecting sharp discontinuities higher than one period of the projected fringe pattern; moreover, phase unwrapping becomes a problem. In this paper, a method to retrieve surface topography trough the projection of a single fringe pattern in gray levels is proposed. The correct phase is unwrapped through the use of Fourier methods and partition functions obtained from the phase. Experimental results show that the method can deal with the projection of high frequency fringes, being limited mainly by the resolution of the projector-detector system.

KW - FFT

KW - FTP

KW - Profilometry

KW - Shape measurement

UR - http://www.scopus.com/inward/record.url?scp=84920972581&partnerID=8YFLogxK

U2 - 10.1016/j.optlaseng.2014.12.016

DO - 10.1016/j.optlaseng.2014.12.016

M3 - Artículo

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VL - 68

SP - 111

EP - 120

JO - Optics and Lasers in Engineering

JF - Optics and Lasers in Engineering

ER -

One shot profilometry using phase partitions

Abstract

Keywords

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