Microstructural analysis for europium in CdTe films

M. González-Alcudia, M. Zapata-Torres, M. Meléndez-Lira, O. Calzadilla Amaya

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    CdTe:Eu films were grown by the pulsed laser deposition method on glass substrates. The targets were prepared with three different concentrations of Cd, Te and Eu employing CdTe and EuTe powders, homogenized by ball milling. X-ray diffraction measurements showed that the samples grown with a mixture of phases related with the structure of CdTe and EuTe, with a little increase of the lattice parameter. Scanning electron micrographs revealed that CdTe:Eu films presented a texture similar to solidified drops. Optical transmission spectroscopy was used for determinate the band gap of samples. Raman spectroscopy results shown broadening of Raman features associated with the structure of CdTe and EuTe with nominal Eu content. © 2008.
    Original languageAmerican English
    Pages (from-to)570-574
    Number of pages512
    JournalSuperlattices and Microstructures
    StatePublished - 1 May 2008


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