TY - JOUR
T1 - Light emitting mechanisms in Si-rich SiNx films with different silicon nitride stoichiometry
AU - Torchynska, Tetyana
AU - Vergara Hernandez, Erasto
AU - Khomenkova, Larysa
AU - Slaoui, Abdelilah
N1 - Publisher Copyright:
© 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
PY - 2017/8
Y1 - 2017/8
N2 - Silicon-rich silicon nitride films with different stoichiometry were grown on the silicon substrate using the plasma-enhanced chemical vapor deposition. The excess silicon content in the films was monitored via varying the NH3/SiH4 gas flow ratio from 0.45 up to 1.0. High-temperature annealing was employed to produce the silicon nanocrystals (NCs) in the films and to enhance the photoluminescence in the range of 1.6–2.9 eV. Optical parameters of films were estimated by means of spectroscopic ellipsometry. Photoluminescence (PL) and its temperature dependences were studied as well. PL spectra were found to be complex due to the contribution of several radiative channels in the emission process. It was determined that their competition leads to the non-monotonous variation of total PL peak position with the increase of Si excess content. The analysis of PL temperature dependencies has revealed that the “blue–orange” emission is owing to the radiative host defects, whereas the “red” PL band is caused by the exciton recombination in Si NCs. The way to control emission is discussed.
AB - Silicon-rich silicon nitride films with different stoichiometry were grown on the silicon substrate using the plasma-enhanced chemical vapor deposition. The excess silicon content in the films was monitored via varying the NH3/SiH4 gas flow ratio from 0.45 up to 1.0. High-temperature annealing was employed to produce the silicon nanocrystals (NCs) in the films and to enhance the photoluminescence in the range of 1.6–2.9 eV. Optical parameters of films were estimated by means of spectroscopic ellipsometry. Photoluminescence (PL) and its temperature dependences were studied as well. PL spectra were found to be complex due to the contribution of several radiative channels in the emission process. It was determined that their competition leads to the non-monotonous variation of total PL peak position with the increase of Si excess content. The analysis of PL temperature dependencies has revealed that the “blue–orange” emission is owing to the radiative host defects, whereas the “red” PL band is caused by the exciton recombination in Si NCs. The way to control emission is discussed.
KW - photoluminescence
KW - silicon nanocrystals
KW - silicon nitride
KW - spectroscopic ellipsometry
UR - http://www.scopus.com/inward/record.url?scp=85026864754&partnerID=8YFLogxK
U2 - 10.1002/pssb.201600670
DO - 10.1002/pssb.201600670
M3 - Artículo
SN - 0370-1972
VL - 254
JO - physica status solidi (b)
JF - physica status solidi (b)
IS - 8
M1 - 1600670
ER -