TY - GEN
T1 - Influence of surface pre-treatment on electrochemical properties of CeO2 thin films deposited by R.F. Sputtering on AA7075 aluminum alloy
AU - Brachetti-Sibaja, S. B.
AU - Domínguez-Crespo, M. A.
AU - Rodil, S. E.
AU - Torres-Huerta, A. M.
PY - 2013
Y1 - 2013
N2 - Nanocrystalline CeO2 coatings were grown on AA7075 aluminum alloy substrates using RF magnetron sputtering and analyzed as protective barriers inhibiting the pitting corrosion reactions in chloride medium. Special attention was placed in the effect of alkaline and acid pretreatments on structural, morphological and electrochemical properties of CeO2 coatings. For this purpose, a CeO2 target under Ar atmosphere was used at room temperature employing different powers. The as-prepared films were characterized by Spectroscopic Ellipsometry (SE), X-Ray Diffraction (XRD), Scanning Electron Microscopy (SEM) and electrochemical techniques such as polarization resistance (Rp) and potentiodynamic curves. The thickness of the as-deposited samples was quite different varying from 114 to 1575 nm for 40 and 120 W, respectively. The obtained coatings were composed of CeO2 particles with uniform, porous and crack-free film and the typical crystalline face centered cubic structure. The corrosion resistance of CeO2 coatings increases proportionally to the applied chemical pretreatment. Additionally, it was found that the electrochemical behavior has a direct relation with the pretreatment concentration but not with the thickness coatings.
AB - Nanocrystalline CeO2 coatings were grown on AA7075 aluminum alloy substrates using RF magnetron sputtering and analyzed as protective barriers inhibiting the pitting corrosion reactions in chloride medium. Special attention was placed in the effect of alkaline and acid pretreatments on structural, morphological and electrochemical properties of CeO2 coatings. For this purpose, a CeO2 target under Ar atmosphere was used at room temperature employing different powers. The as-prepared films were characterized by Spectroscopic Ellipsometry (SE), X-Ray Diffraction (XRD), Scanning Electron Microscopy (SEM) and electrochemical techniques such as polarization resistance (Rp) and potentiodynamic curves. The thickness of the as-deposited samples was quite different varying from 114 to 1575 nm for 40 and 120 W, respectively. The obtained coatings were composed of CeO2 particles with uniform, porous and crack-free film and the typical crystalline face centered cubic structure. The corrosion resistance of CeO2 coatings increases proportionally to the applied chemical pretreatment. Additionally, it was found that the electrochemical behavior has a direct relation with the pretreatment concentration but not with the thickness coatings.
UR - http://www.scopus.com/inward/record.url?scp=84906087423&partnerID=8YFLogxK
U2 - 10.1149/04701.0157ecst
DO - 10.1149/04701.0157ecst
M3 - Contribución a la conferencia
AN - SCOPUS:84906087423
SN - 9781607684428
T3 - ECS Transactions
SP - 157
EP - 166
BT - 27th Congress of the Mexican Society of Electrochemistry, MES 2012/5th Meeting of the ECS Mexican Section
PB - Electrochemical Society Inc.
T2 - 27th Congress of the Mexican Society of Electrochemistry, MES 2012 and 5th Meeting of the ECS Mexican Section
Y2 - 11 June 2012 through 15 June 2012
ER -