Influence of annealing on the critical temperature of Bi-Pb-Sr-Ca-Cu-O thin films

E. Díaz-Valdés; C. Mejía-García; J. L. López-López; M. Jergel

doi:10.1007/s10854-007-9286-5

Influence of annealing on the critical temperature of Bi-Pb-Sr-Ca-Cu-O thin films

E. Díaz-Valdés, C. Mejía-García, J. L. López-López, M. Jergel

Escuela Superior de Física y Matemáticas (ESFM)

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

Superconducting Bi-Pb-Sr-Ca-Cu-O (BPSCCO) thin films were grown on MgO substrates by a spray pyrolysis technique, followed by a solid-state reaction. The thin films with nominal composition Bi _1.65 Pb _0.4Sr _1.2Ca _1.2Cu _2.5 (NO ₃) _δ were grown varying mainly the annealing temperature between 835 and 855 °C in order to observe the influence on the critical temperature T _c. At 855 °C the higher T _c was obtained for the 2212 phase. The thin films were then analyzed by X-ray diffraction, R-T measurements and atomic absorption spectroscopy.

Translated title of the contribution	Influencia del recocido en la temperatura crítica de películas delgadas de Bi-Pb-Sr-Ca-Cu-O
Original language	English
Pages (from-to)	1167-1170
Number of pages	4
Journal	Journal of Materials Science: Materials in Electronics
Volume	18
Issue number	11
DOIs	https://doi.org/10.1007/s10854-007-9286-5
State	Published - Nov 2007

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title = "Influence of annealing on the critical temperature of Bi-Pb-Sr-Ca-Cu-O thin films",

abstract = "Superconducting Bi-Pb-Sr-Ca-Cu-O (BPSCCO) thin films were grown on MgO substrates by a spray pyrolysis technique, followed by a solid-state reaction. The thin films with nominal composition Bi 1.65 Pb 0.4Sr 1.2Ca 1.2Cu 2.5 (NO 3) δ were grown varying mainly the annealing temperature between 835 and 855 °C in order to observe the influence on the critical temperature T c. At 855 °C the higher T c was obtained for the 2212 phase. The thin films were then analyzed by X-ray diffraction, R-T measurements and atomic absorption spectroscopy.",

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T1 - Influence of annealing on the critical temperature of Bi-Pb-Sr-Ca-Cu-O thin films

AU - Díaz-Valdés, E.

AU - Mejía-García, C.

AU - López-López, J. L.

AU - Jergel, M.

PY - 2007/11

Y1 - 2007/11

N2 - Superconducting Bi-Pb-Sr-Ca-Cu-O (BPSCCO) thin films were grown on MgO substrates by a spray pyrolysis technique, followed by a solid-state reaction. The thin films with nominal composition Bi 1.65 Pb 0.4Sr 1.2Ca 1.2Cu 2.5 (NO 3) δ were grown varying mainly the annealing temperature between 835 and 855 °C in order to observe the influence on the critical temperature T c. At 855 °C the higher T c was obtained for the 2212 phase. The thin films were then analyzed by X-ray diffraction, R-T measurements and atomic absorption spectroscopy.

AB - Superconducting Bi-Pb-Sr-Ca-Cu-O (BPSCCO) thin films were grown on MgO substrates by a spray pyrolysis technique, followed by a solid-state reaction. The thin films with nominal composition Bi 1.65 Pb 0.4Sr 1.2Ca 1.2Cu 2.5 (NO 3) δ were grown varying mainly the annealing temperature between 835 and 855 °C in order to observe the influence on the critical temperature T c. At 855 °C the higher T c was obtained for the 2212 phase. The thin films were then analyzed by X-ray diffraction, R-T measurements and atomic absorption spectroscopy.

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JO - Journal of Materials Science: Materials in Electronics

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ER -

Influence of annealing on the critical temperature of Bi-Pb-Sr-Ca-Cu-O thin films

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