TY - GEN
T1 - Electron field emission from films of palladium oxide nanoparticles
AU - Baca-Arroyo, R.
AU - Rodríguez, C. A.López
AU - Galvan-Arellano, M.
AU - Romero-Paredes, G.
AU - Peña-Sierra, R.
PY - 2008
Y1 - 2008
N2 - Electron Field Emission at atmospheric pressure from films of palladium oxide (PdO) nanoparticles is demonstrated. PdO nanoparticles with average height of 9-45nm were grown on silicon substrates by oxidizing film of Pd nanoparticles. The field emission current was measured in a parallel plate diode configuration structure with 1μm of separation between cathode and anode. The current-voltage characteristics of the structure were measured with voltages between ±100V. The electrical current of the structure without film of nanoemitters was 4 nA at 100V, the maximum current measured with films of PdO nanoemitters was of 1μA at the same voltage.
AB - Electron Field Emission at atmospheric pressure from films of palladium oxide (PdO) nanoparticles is demonstrated. PdO nanoparticles with average height of 9-45nm were grown on silicon substrates by oxidizing film of Pd nanoparticles. The field emission current was measured in a parallel plate diode configuration structure with 1μm of separation between cathode and anode. The current-voltage characteristics of the structure were measured with voltages between ±100V. The electrical current of the structure without film of nanoemitters was 4 nA at 100V, the maximum current measured with films of PdO nanoemitters was of 1μA at the same voltage.
KW - Field emission current
KW - Field enhancement factor
KW - Nanoemitters
KW - PdO
UR - http://www.scopus.com/inward/record.url?scp=61549137758&partnerID=8YFLogxK
U2 - 10.1109/ICEEE.2008.4723447
DO - 10.1109/ICEEE.2008.4723447
M3 - Contribución a la conferencia
AN - SCOPUS:61549137758
SN - 9781424424993
T3 - 2008 5th International Conference on Electrical Engineering, Computing Science and Automatic Control, CCE 2008
SP - 485
EP - 488
BT - 2008 5th International Conference on Electrical Engineering, Computing Science and Automatic Control, CCE 2008
T2 - 2008 5th International Conference on Electrical Engineering, Computing Science and Automatic Control, CCE 2008
Y2 - 12 November 2008 through 14 November 2008
ER -