Abstract
Eu3+-(5% mol)-doped Lu2SiO5 optical quality films were prepared using the sol–gel
method and dip-coating technique from lutetium and europium salts as the lanthanide precursors
and tetraethyl orthosilicate (TEOS) as the silicon source. To increase the thickness of the films,
3-Glycidyloxypropyl trimethoxysilane (Glymo) was added as the rheological agent during sol formation. Structural, morphological, and luminescent properties were investigated for Lu2SiO5
,
Eu3+:Lu2SiO5
, and Eu3+:Lu2SiO5/Glymo in order to obtain high quality in luminescent films. X-ray
diffraction (XRD) results show that the incorporation of the Eu3+ ions do not affect the A-Type and
B-Type monoclinic crystalline phase typical of Lu2SiO5
, even after five dipping cycles on quartz
substrates and a final annealing process at 1100 ◦C. The morphology and topography of the films
were studied by SEM and AFM. These techniques revealed films without surfactant that were uniform
with low rugosity while the film with surfactant presented porous hills and valleys with uneven
high values of roughness. The photoluminescence spectrum of Eu3+:Lu2SiO5 films showed 2 broad
emission peaks centered at 589 nm and 612 nm. The presence of Glymo in the system promoted the
formation of residual Lu2Si2O7 compounds with the highest lifetime values compared with films
without surfactant. The results of the films are promising for luminescent applications.
method and dip-coating technique from lutetium and europium salts as the lanthanide precursors
and tetraethyl orthosilicate (TEOS) as the silicon source. To increase the thickness of the films,
3-Glycidyloxypropyl trimethoxysilane (Glymo) was added as the rheological agent during sol formation. Structural, morphological, and luminescent properties were investigated for Lu2SiO5
,
Eu3+:Lu2SiO5
, and Eu3+:Lu2SiO5/Glymo in order to obtain high quality in luminescent films. X-ray
diffraction (XRD) results show that the incorporation of the Eu3+ ions do not affect the A-Type and
B-Type monoclinic crystalline phase typical of Lu2SiO5
, even after five dipping cycles on quartz
substrates and a final annealing process at 1100 ◦C. The morphology and topography of the films
were studied by SEM and AFM. These techniques revealed films without surfactant that were uniform
with low rugosity while the film with surfactant presented porous hills and valleys with uneven
high values of roughness. The photoluminescence spectrum of Eu3+:Lu2SiO5 films showed 2 broad
emission peaks centered at 589 nm and 612 nm. The presence of Glymo in the system promoted the
formation of residual Lu2Si2O7 compounds with the highest lifetime values compared with films
without surfactant. The results of the films are promising for luminescent applications.
| Translated title of the contribution | Efecto del Glymo en las propiedades morfologcas y opticas de peliculas de Lu2SiO5 dopadas con Eu3+ |
|---|---|
| Original language | English |
| Article number | 13050915 |
| Pages (from-to) | 1 |
| Number of pages | 13 |
| Journal | Coatings |
| Volume | 13 |
| Issue number | 915 |
| DOIs | |
| State | Published - 12 May 2023 |