Effect of alloying elements in the electrochemical behavior of Al-Si-Mg alloys in aqueous solutions

M. A. Pech-Canul, M. I. Pech-Canul, M. Echeverría, E. E. Coral-Escobar, M. Montoya-Dávila

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

The anodic polarization behavior of aluminum alloys with varying Si and Mg content in borate solutions with and without 0.01M NaCl was compared to that for pure Al. All the investigated Al-Si-Mg alloys have a better pitting resistance, compared to Al. By means of XPS measurements it was shown that silicon enters into the passive film mainly as SiO2; it has been proposed that in this oxidized form silicon alters the acid-base properties of the passive film and helps to reject chloride ions from the surface. Results of polarization measurements also showed that a significant contribution to the measured current density comes from the anodic reactivity of the intermetallic Mg2Si in aqueous solutions; the effect is more important in alloys where these intermetallics are large.

Original languageEnglish
Title of host publicationMaterials Processing and Properties
PublisherMinerals, Metals and Materials Society
Pages209-214
Number of pages6
ISBN (Print)9780873397513
StatePublished - 2010
Externally publishedYes
EventTMS 2010 - 139th Annual Meeting and Exhibition - Seattle, WA, United States
Duration: 14 Feb 201018 Feb 2010

Publication series

NameTMS Annual Meeting
Volume1

Conference

ConferenceTMS 2010 - 139th Annual Meeting and Exhibition
Country/TerritoryUnited States
CitySeattle, WA
Period14/02/1018/02/10

Keywords

  • Al-Si-Mg alloys
  • Passive film
  • Pitting resistance

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