Design and construction of the automated scatterometer for particle sizing

Y. Pérez-Moret, Javier A. Martínez, M. P. Hernández, J. O. Abad, R. Sis, E. Lo Gioudice, Hernani Yee-Madeira, J. A. Díaz-Góngora

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A design of a scatterometer is described for applications of Mie theory. The instrument comprises a goniometer, a lock-in amplifier, a laser, and a photomultiplier tube (PMT). An embedded control programmable hardware and Windows-based Virtual Instruments simplify the design of automation of the scatterometer. The software has been modularly designed to provide independent control of the stepper motor for the motion of goniometer arm, running and on-line displaying of angular scans, auto storage of the angular scan data. The obtained benefits include facilitation of advanced data-collection techniques and collection of higher quality data. Quasimonodisperse particle of the latex have been characterized with this set up. The measured size particles are close to the reported nominal values. This result indicated that the experimental setup warrants adequate quality measurement, which allows a reasonable solution to inverse problem.

Translated title of the contributionDiseño y construcción del dispersómetro automatizado para el tamaño de partículas
Original languageEnglish
Title of host publication22nd Congress of the International Commission for Optics
Subtitle of host publicationLight for the Development of the World
DOIs
StatePublished - 2011
Event22nd Congress of the International Commission for Optics: Light for the Development of the World - Puebla, Mexico
Duration: 15 Aug 201119 Aug 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8011
ISSN (Print)0277-786X

Conference

Conference22nd Congress of the International Commission for Optics: Light for the Development of the World
Country/TerritoryMexico
CityPuebla
Period15/08/1119/08/11

Keywords

  • Instrumentation and measurement
  • Laser applications
  • Microcontrollers
  • Optics
  • automated instrumentation
  • size particle measurements

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