Contributions to the defocusing effect on pole figure measurements by X-ray diffraction

J. Palacios Gómez, R. S. Salat Figols, A. Jiménez Jiménez, T. Kryshtab

Research output: Contribution to journalArticleResearchpeer-review

Abstract

A simple method, considering a parallel beam approximation has been made to reproduce the main features of the defocusing effect, observed when pole figures are measured with the Schulz reflection technique using X-ray diffraction. A Lorentzian curve was used to approximate the primary beam profile. This method applied to low index reflections of copper and silver shows qualitatively and partially quantitatively, the extent the elongation of the ellipse resulting from the intersection of the beam with the tilted sample causes the defocusing effect. Differences observed experimentally are attributed mainly to the divergence of the beam, but also partially to the particular primary beam profile. Additionally, measurements with two different vertical heights of the receiving slit, i.e. the measured arch length of the Debye-Scherrer ring, indicate that this parameter plays no role in defocusing.
Original languageAmerican English
Pages (from-to)296-300
Number of pages265
JournalRevista Mexicana de Fisica
StatePublished - 1 Jan 2015

Fingerprint

defocusing
Poles
poles
X-ray diffraction
X ray diffraction
ellipse
Arches
diffraction
arch
Elongation
silver
Silver
x rays
divergence
copper
Copper
arches
ellipses
profiles
intersections

Cite this

@article{5487c6d5524949b3835a47ddac9e6561,
title = "Contributions to the defocusing effect on pole figure measurements by X-ray diffraction",
abstract = "A simple method, considering a parallel beam approximation has been made to reproduce the main features of the defocusing effect, observed when pole figures are measured with the Schulz reflection technique using X-ray diffraction. A Lorentzian curve was used to approximate the primary beam profile. This method applied to low index reflections of copper and silver shows qualitatively and partially quantitatively, the extent the elongation of the ellipse resulting from the intersection of the beam with the tilted sample causes the defocusing effect. Differences observed experimentally are attributed mainly to the divergence of the beam, but also partially to the particular primary beam profile. Additionally, measurements with two different vertical heights of the receiving slit, i.e. the measured arch length of the Debye-Scherrer ring, indicate that this parameter plays no role in defocusing.",
author = "{Palacios G{\'o}mez}, J. and {Salat Figols}, {R. S.} and {Jim{\'e}nez Jim{\'e}nez}, A. and T. Kryshtab",
year = "2015",
month = "1",
day = "1",
language = "American English",
pages = "296--300",
journal = "Revista Mexicana de Fisica",
issn = "0035-001X",
publisher = "Sociedad Mexicana de Fisica",

}

Contributions to the defocusing effect on pole figure measurements by X-ray diffraction. / Palacios Gómez, J.; Salat Figols, R. S.; Jiménez Jiménez, A.; Kryshtab, T.

In: Revista Mexicana de Fisica, 01.01.2015, p. 296-300.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - Contributions to the defocusing effect on pole figure measurements by X-ray diffraction

AU - Palacios Gómez, J.

AU - Salat Figols, R. S.

AU - Jiménez Jiménez, A.

AU - Kryshtab, T.

PY - 2015/1/1

Y1 - 2015/1/1

N2 - A simple method, considering a parallel beam approximation has been made to reproduce the main features of the defocusing effect, observed when pole figures are measured with the Schulz reflection technique using X-ray diffraction. A Lorentzian curve was used to approximate the primary beam profile. This method applied to low index reflections of copper and silver shows qualitatively and partially quantitatively, the extent the elongation of the ellipse resulting from the intersection of the beam with the tilted sample causes the defocusing effect. Differences observed experimentally are attributed mainly to the divergence of the beam, but also partially to the particular primary beam profile. Additionally, measurements with two different vertical heights of the receiving slit, i.e. the measured arch length of the Debye-Scherrer ring, indicate that this parameter plays no role in defocusing.

AB - A simple method, considering a parallel beam approximation has been made to reproduce the main features of the defocusing effect, observed when pole figures are measured with the Schulz reflection technique using X-ray diffraction. A Lorentzian curve was used to approximate the primary beam profile. This method applied to low index reflections of copper and silver shows qualitatively and partially quantitatively, the extent the elongation of the ellipse resulting from the intersection of the beam with the tilted sample causes the defocusing effect. Differences observed experimentally are attributed mainly to the divergence of the beam, but also partially to the particular primary beam profile. Additionally, measurements with two different vertical heights of the receiving slit, i.e. the measured arch length of the Debye-Scherrer ring, indicate that this parameter plays no role in defocusing.

UR - https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84931410472&origin=inward

UR - https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=84931410472&origin=inward

M3 - Article

SP - 296

EP - 300

JO - Revista Mexicana de Fisica

JF - Revista Mexicana de Fisica

SN - 0035-001X

ER -