Concentration-dependent photoluminescence of Te-doped In 0.14Ga0.86As0.13Sb0.87

J. Díaz-Reyes, J. G. Mendoza-Álvarez, M. L. Gómez-Herrera

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Abstract

Quaternary layers of N-typeInxGa1-xAs ySb1-y were grown by liquid phase epitaxy on (100) GaSb substrates under lattice-matching conditions. Low-temperature photoluminescence spectra were obtained as a function of tellurium concentration. These spectra were interpreted taking into account the nonparabolicity of the conduction band. Calculations of the peak position and photoluminescence transitions were performed. Both the band filled as well as band tailing effects due to Coulomb interaction of free carriers with ionized impurities and shrinkage due to exchange interaction between free carriers were considered in order to properly account for the observed features of the photoluminescence spectra. It is shown that the band-to-band energy transition can be used to obtain the carrier concentration in N-typeInxGa1-xAsySb 1-y, in the range from 1 × 1016 to 3.42 × 1018cm-3.

Original languageEnglish
Article number013
Pages (from-to)10861-10869
Number of pages9
JournalJournal of Physics Condensed Matter
Volume18
Issue number48
DOIs
StatePublished - 6 Dec 2006

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