Characterization of sputtered Ge-Sn thin films by high resolution methods

H. A. Calderón, M. A. Vidal, Héctor Ladrón De Guevara

Research output: Contribution to conferencePaper

2 Scopus citations
Original languageAmerican English
Pages712-713
Number of pages640
DOIs
StatePublished - 1 Aug 2006
EventMicroscopy and Microanalysis -
Duration: 1 Jan 2014 → …

Conference

ConferenceMicroscopy and Microanalysis
Period1/01/14 → …

Cite this

Calderón, H. A., Vidal, M. A., & De Guevara, H. L. (2006). Characterization of sputtered Ge-Sn thin films by high resolution methods. 712-713. Paper presented at Microscopy and Microanalysis, . https://doi.org/10.1017/S1431927606064324