Translated title of the contribution | Caracterización de películas delgadas de Ge-Sn pulverizadas mediante métodos de alta resolución |
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Original language | English |
Pages (from-to) | 712-713 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 12 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - Aug 2006 |
Characterization of sputtered Ge-Sn thin films by high resolution methods
H. A. Calderón, M. A. Vidal, Héctor Ladrón De Guevara
Research output: Contribution to journal › Article › peer-review
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