Characterization of sputtered Ge-Sn thin films by high resolution methods

H. A. Calderón, M. A. Vidal, Héctor Ladrón De Guevara

Research output: Contribution to journalArticlepeer-review

2 Scopus citations
Translated title of the contributionCaracterización de películas delgadas de Ge-Sn pulverizadas mediante métodos de alta resolución
Original languageEnglish
Pages (from-to)712-713
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 2006

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