Characterization of Pt-Pd bimetallic nanoparticles by Cs-corrected STEM

O. Téllez-Vázquez, R. Esparza, G. Rodríguez-Ortiz, Amado F. García-Ruiz, R. Pérez, M. José-Yacamán

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Pt-Pd bimetallic nanoparticles were characterized using aberration (Cs) corrected scanning transmission electron microscopy (STEM) along with molecular dynamics simulations. The nanoparticles were synthesized through a microwave-assisted process. This technique has been applied to synthesize metallic nanoparticles at relatively short times, allowing a good control of size distribution. The structure of the bimetallic nanoparticles is fcc-like with an average size of 5 nm. To understand the properties of the bimetallic nanoparticles, it is necessary to know the positions of all the atoms in the nanostructure. We have used a recent quantitative method to analyze HAADF STEM images which allowed us to measure the total intensity of the scattered electrons for each atomic column. Beside with the characterization of the nanoparticles, we have performed classical molecular dynamics simulation for the structural and dynamical analysis of the cuboctahedral Pt-Pd bimetallic nanoparticles.

Original languageEnglish
Title of host publicationStructural and Chemical Characterization of Metals, Alloys and Compounds
PublisherTrans Tech Publications Ltd
Pages69-74
Number of pages6
ISBN (Print)9783037856574
DOIs
StatePublished - 2013
Event21st International Materials Research Congress, IMRC 2012 - Cancun, Mexico
Duration: 12 Aug 201217 Aug 2012

Publication series

NameMaterials Science Forum
Volume755
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Conference

Conference21st International Materials Research Congress, IMRC 2012
Country/TerritoryMexico
CityCancun
Period12/08/1217/08/12

Keywords

  • Aberration corrected
  • Electron microscopy
  • Microwave-assisted process
  • Molecular dynamics
  • Nanostructure
  • Pt-Pd

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