Atomic resolution characterization of Ni base nanoparticles for energy devices

H. A. Calderon; F. Godinez-Salomon; O. Solorza-Feria; P. Specht; C. Kisielowski

doi:10.1017/S1431927614007429

Atomic resolution characterization of Ni base nanoparticles for energy devices

H. A. Calderon, F. Godinez-Salomon, O. Solorza-Feria, P. Specht, C. Kisielowski

Escuela Superior de Física y Matemáticas (ESFM)

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	1138-1139
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614007429
State	Published - 1 Aug 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: 3 Aug 2014 → 7 Aug 2014

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author = "Calderon, {H. A.} and F. Godinez-Salomon and O. Solorza-Feria and P. Specht and C. Kisielowski",

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T1 - Atomic resolution characterization of Ni base nanoparticles for energy devices

AU - Calderon, H. A.

AU - Godinez-Salomon, F.

AU - Solorza-Feria, O.

AU - Specht, P.

AU - Kisielowski, C.

PY - 2014/8/1

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DO - 10.1017/S1431927614007429

M3 - Artículo de la conferencia

AN - SCOPUS:84927933963

SN - 1431-9276

VL - 20

SP - 1138

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Atomic resolution characterization of Ni base nanoparticles for energy devices

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