AFM and FTIR characterization of microcrystalline Si obtained from isothermal annealing of Al/a-Si:H

M. Rojas-López, A. Orduña-Díaz, R. Delgado-Macuil, J. Olvera-Hernández, H. Navarro-Contreras, M. A. Vidal, N. Saucedo, V. H. Mendez-García

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