Abstract
A method is presented to obtain the orientation curve in the Eulerian space, of crystallites which diffract in one point of a Debye-Scherer ring in a second diffraction process. The incident beam is therefore the reflected beam of a previous diffraction process, and the sample has a general orientation for a pole figure measurement, given as usual by two angles, χ around the sample Y axis, and ϕ around the sample normal. Two solutions are found for all secondary reflections. The method proposed here was outlined somewhere else for the measurement of pole figures by neutron diffraction [1], and here important improvements are made, especially regarding the mathematical methods.
Original language | English |
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Pages (from-to) | 375-380 |
Number of pages | 6 |
Journal | Revista Mexicana de Fisica |
Volume | 64 |
Issue number | 4 |
DOIs | |
State | Published - 2018 |
Keywords
- Extinction
- Texture
- X-ray diffraction