Engineering & Materials Science
Organic solar cells
100%
Thin film transistors
68%
Polymer films
47%
Solar cells
37%
Heterojunctions
36%
Zinc oxide
23%
Hole mobility
23%
Plasma enhanced chemical vapor deposition
22%
Fabrication
21%
Semiconductor materials
20%
Electrons
20%
Polymethyl methacrylates
18%
Electron injection
18%
Parameter extraction
17%
Lithium Fluoride
17%
Cathodes
16%
Current density
15%
Metals
15%
Dielectric films
15%
Conversion efficiency
14%
Simulators
14%
Amorphous silicon
14%
Indium
13%
Networks (circuits)
13%
Buffer layers
13%
Polymer solar cells
12%
Hydrothermal synthesis
11%
Organic semiconductor materials
11%
Computer hardware description languages
11%
Electron mobility
11%
Excimer lasers
10%
Light absorption
10%
Schottky barrier diodes
10%
Transconductance
10%
Carrier mobility
10%
Nanorods
10%
Polymers
10%
Graphene oxide
10%
Tin oxides
9%
Temperature
9%
Silicon carbide
9%
Annealing
9%
Energy gap
8%
Transport properties
8%
Spin coating
8%
Electric fields
8%
Photons
8%
Lighting
8%
Circuit simulation
8%
Threshold voltage
7%
Physics & Astronomy
solar cells
31%
transistors
15%
zinc oxides
15%
Schottky diodes
14%
polymers
14%
performance
14%
traps
13%
simulation
10%
amorphous silicon
10%
thin films
10%
cathodes
10%
silicon carbides
9%
rectifiers
8%
transconductance
8%
inverters
8%
lithium fluorides
8%
laser annealing
8%
hole mobility
8%
buffers
7%
excimer lasers
7%
nanorods
6%
metal oxides
6%
simulators
6%
illumination
6%
metals
6%
heterojunctions
6%
nanocomposites
6%
fabrication
5%
graphene
5%
curves
5%
air
5%
optimization
5%
degradation
5%
synthesis
5%
Chemistry
Simulation
19%
Amorphous Material
18%
Amorphous Silicon
15%
Transconductance
14%
Compound Mobility
14%
Laser Annealing
12%
Solar Cell
12%
Cathode
11%
Silicon Carbide
10%
Voltage
10%
Energy
10%
Zinc Oxide Nanorod
9%
Schottky Barrier
9%
Zinc Oxide
9%
P63
8%
Fluoride
8%
Polycrystalline Solid
7%
Excimer
7%
Spin Coating
7%
Semiconductor
7%
Buffer Solution
6%
Metal Oxide
5%
Ultraviolet Spectrum
5%
Graphene Oxide
5%
Reflection
5%
Hydrothermal Method
5%
Scanning Electron Microscopy
5%
Space Group
5%